• DocumentCode
    2585727
  • Title

    Kinetic Characterisation of Molding Compounds

  • Author

    Jansen, K.M.B. ; Qian, C. ; Ernst, L.J. ; Bohm, C. ; Kessler, A. ; Preu, H. ; Stecher, M.

  • Author_Institution
    Delft Univ. of Technol., Delft
  • fYear
    2007
  • fDate
    16-18 April 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    During the packaging of electronic components stresses are generated due to curing effects and the difference in thermal shrinkage between molding compound and die. For a reliable simulation of the stresses generated in a package during cure and subsequent cooling it is essential to have accurate data for the thermal and mechanical properties of the molding compound, die, solder and substrate materials. Of these materials the molding compound is by far the most difficult one to model since these properties vary widely and are time, conversion and temperature dependent. The present paper consists of an extensive study on several commercial molding compounds of which the kinetic parameters we obtained by analysing both isothermal and non-isothermal differential scanning calorimetry (DSC) data. For the modelling of the kinetics data it turned out to be necessary to take the diffusion limitation effect (incomplete cure at lower temperatures) into account. The glass transition versus conversion could be modelled satisfactory using the well known DiBenedetto equation.
  • Keywords
    differential scanning calorimetry; diffusion; electronics packaging; glass transition; polymers; DiBenedetto equation; differential scanning calorimetry; diffusion limitation effect; electronic components stress packaging; glass transition; molding compounds; thermal shrinkage; Curing; Electronic components; Electronic packaging thermal management; Electronics cooling; Isothermal processes; Kinetic theory; Materials reliability; Mechanical factors; Temperature dependence; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
  • Conference_Location
    London
  • Print_ISBN
    1-4244-1105-X
  • Electronic_ISBN
    1-4244-1106-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2007.360002
  • Filename
    4201169