DocumentCode :
2585761
Title :
Dielectric parameters recognition by using a waveguide cavity and a rigorous processing algorithm
Author :
Poyedinchuk, Anatoliy Ye ; Kirilenko, Anatoliy A. ; Yashina, Nataliya P.
Author_Institution :
IRE, NASU, Kharkov, Ukraine
Volume :
2
fYear :
2002
fDate :
10-13 Sept. 2002
Firstpage :
482
Abstract :
Measurement of scattered electromagnetic field and further permittivity or permeability reconstruction based on experimental data and adequate mathematical models is the key issue in dielectric materials study. Accuracy of measurements and adequacy of mathematical models is of principal importance. We consider a resonator that can be used for a thin film study, its electromagnetic model, and advantages and capacities of a corresponding numerical algorithm.
Keywords :
cavity resonators; dielectric resonators; electromagnetic fields; permittivity; dielectric parameters recognition; electromagnetic model; permeability reconstruction; permittivity reconstruction; resonator; rigorous processing algorithm; scattered electromagnetic field; waveguide cavity; Dielectric materials; Dielectric measurements; Dielectric thin films; Electromagnetic fields; Electromagnetic measurements; Electromagnetic scattering; Electromagnetic waveguides; Mathematical model; Permeability measurement; Permittivity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mathematical Methods in Electromagnetic Theory, 2002. MMET '02. 2002 International Conference on
Conference_Location :
Kiev, Ukraine
Print_ISBN :
0-7803-7391-X
Type :
conf
DOI :
10.1109/MMET.2002.1106972
Filename :
1106972
Link To Document :
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