DocumentCode :
2585977
Title :
Miniaturized UWB bandpass filters integrated with notch filters using a silicon-based integrated passive device technology
Author :
Wu, Zhengzheng ; Shim, Yonghyun ; Rais-Zadeh, Mina
Author_Institution :
EECS Dept., Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2011
fDate :
5-10 June 2011
Firstpage :
1
Lastpage :
4
Abstract :
This paper reports on the implementation of miniaturized UWB filters with low loss, steep rejection, and spurious-free response on a silicon substrate. A UWB filter is demonstrated with an insertion loss of less than 1 dB, 3 dB bandwidth of 7.25 GHz, attenuation of more than 30 dB in both the lower (10 MHz-2.6 GHz) and the upper (12 GHz-20 GHz) stop-bands, occupying only 2.9 mm × 2.4 mm of die area. In addition, a novel design is proposed for the implementation of a narrowband notch filter, which can be integrated with UWB bandpass filters for rejecting strong in-band interferences. A UWB filter integrated with a notch filter is presented having a total footprint of 4.6 mm × 2.9 mm. The notch filter centered at 5.285 GHz provides a maximum attenuation of 23 dB with 10 dB fractional bandwidth of 7% to reject WLAN/WiMAX interferences. The temperature stability of the notch filter is better than 0.4 % in the temperature range of -30 °C to 70 °C.
Keywords :
band-pass filters; notch filters; ultra wideband technology; WLAN/WiMAX interference; bandwidth 7.25 GHz; fractional bandwidth; frequency 10 MHz to 2.6 GHz; frequency 12 GHz to 20 GHz; frequency 5.285 GHz; in-band interference; insertion loss; miniaturized UWB bandpass filters; narrowband notch filter; notch filters; silicon substrate; silicon-based integrated passive device technology; spurious-free response; steep rejection; temperature -30 C to 70 C; Band pass filters; Delay; Frequency measurement; Loss measurement; Microwave filters; Silicon; Substrates; Bandpass filters; IPD; MEMS filters; UWB; inductive coupling; lumped passives; notch filters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
ISSN :
0149-645X
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2011.5972856
Filename :
5972856
Link To Document :
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