DocumentCode
2586062
Title
Foreword
fYear
2005
fDate
7-11 March 2005
Abstract
Presents the welcome message from the conference proceedings.
Keywords
Automatic testing; Automotive engineering; Circuit testing; Design automation; Electronic equipment testing; Electronics industry; Embedded software; Embedded system; System testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2005. Proceedings
Conference_Location
Munich, Germany
ISSN
1530-1591
Print_ISBN
0-7695-2288-2
Type
conf
DOI
10.1109/DATE.2005.158
Filename
1395514
Link To Document