DocumentCode
2586277
Title
Efficient electrostatic-mechanical modeling of C-V curves of RF-MEMS switches
Author
Bielen, Jeroen ; Stulemeijer, Jiri
Author_Institution
NXP Semicond., Nijmegen
fYear
2007
fDate
16-18 April 2007
Firstpage
1
Lastpage
6
Abstract
The capacitance versus actuation voltage, the C-V curve, is characteristic for the steady state behavior of a RF-MEMS capacitive switch. It is imperative to have an efficient method to simulate these curves and overcome the convergence problems from pull-in and release instability that is inherent to these electrostatic actuated devices. In this paper we show how the complete CV curve can be calculated in FE code, including conditionally stable parts and zipping regions, which also comprises a non-linear contact model. Efficiency improvement by use of a reduced order model for the electrostatic domain is shown. Validity of the simulation results is shown by comparison to measurements.
Keywords
capacitance; electrical contacts; electromechanical effects; electrostatic actuators; finite element analysis; microswitches; reduced order systems; C-V curve; FE code; RF-MEMS switch; actuation voltage; capacitance; capacitive switch; electrostatic actuated device; electrostatic-mechanical modeling; nonlinear contact model; pull-in instability; reduced order model; release instability; steady state property; zipping region; Capacitance; Capacitance-voltage characteristics; Convergence; Electrostatics; Iron; Radiofrequency microelectromechanical systems; Reduced order systems; Steady-state; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
Conference_Location
London
Print_ISBN
1-4244-1105-X
Electronic_ISBN
1-4244-1106-8
Type
conf
DOI
10.1109/ESIME.2007.360032
Filename
4201199
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