DocumentCode :
2586452
Title :
Electro-osmotic Flow Based Cooling System For Microprocessors
Author :
Eng, P.F. ; Nithiarasu, P. ; Arnold, A.K. ; Igic, P. ; Guy, O.J.
Author_Institution :
Sch. of Eng., Univ. of Wales Swansea, Swansea
fYear :
2007
fDate :
16-18 April 2007
Firstpage :
1
Lastpage :
5
Abstract :
An elliptical, electroosmosis device, with many micro channel flow paths has been designed to circulate liquid to cool hot spots on a microprocessor chip. A pair of electrodes deposited 3 mm apart, across the channels, was employed to impose external electric potential. A preliminary experimental setup has been fabricated to determine the flow rate and heat transfer of the micro channel device. A pulsed external electric potential signal was applied to reduce bubbles generated as a result of electrolysis. Silicon dioxide has been used as an electrical isolator to avoid current interference between the cooling device and the microprocessor. Preliminary flow rates measured were 0.04 mul min-1, 0.16 mul min-1, 0.24 mul min-1 using external potential values of 10 V, 20 V and 40 V, respectively. Temperature measurements have demonstrated that an increased rate of heat transfer is possible, if the liquid is forced to move.
Keywords :
bubbles; cooling; electrolysis; electrophoresis; flow measurement; microchannel flow; microprocessor chips; osmosis; silicon compounds; SiO2; electrolysis; electroosmotic flow; elliptical electroosmosis device; flow rate; heat transfer; hot spots; microchannel flow; microprocessor chip cooling system; pulsed external electric potential; silicon dioxide electrical isolator; voltage 10 V; voltage 20 V; voltage 40 V; Cooling; Electric potential; Electrochemical processes; Electrodes; Heat transfer; Isolators; Microprocessor chips; Pulse generation; Signal generators; Silicon compounds; Electroosmosis; MEMS; electronic cooling; experimental; micropumps; multi-disciplinary analysis; numerical;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on
Conference_Location :
London
Print_ISBN :
1-4244-1105-X
Electronic_ISBN :
1-4244-1106-8
Type :
conf
DOI :
10.1109/ESIME.2007.360041
Filename :
4201208
Link To Document :
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