DocumentCode :
2586614
Title :
Efficient Frequency Domain plus Spatial Expansion Method For Semiconductor Devices Modeling
Author :
Leuzzi, Giorgio ; Stornelli, Vincenzo
Author_Institution :
Dept. of Inf. & Electr. Eng., Monteluco di Roio, L´´Aquila
fYear :
2008
fDate :
27-28 Oct. 2008
Firstpage :
354
Lastpage :
357
Abstract :
We here present a method that combines frequency-domain Fourier series expansion and space-domain polynomial expansion of the physical quantities inside the semiconductor, for an efficient numerical modelling of high-frequency active devices, based on the solution of the physical transport equations in the semiconductor. The frequency- and space-domain expansions drastically reduce the number of time and space sampling points where the equations are computed, greatly reducing the computational burden with respect to classical finite-differences approaches. Moreover, the frequency-domain technique eliminates the need for time-to-frequency transforms for a spectral solution, and allows easy inclusion of frequency-dependent parameters of the semiconductor especially important at very high frequencies (e.g. dielectric constant). Also the coupling with a EM program, for a global modeling simulator, becomes straightforward, due to the reduced interconnection nodes with the physical simulator. A demonstrator for PC implementing a quasi-2D model with a hydrodynamic formulation with the first three moments of Boltzmann´s Transport Equation is given, and its results are compared with a standard finite-difference time-domain approach and measured results.
Keywords :
Boltzmann equation; Fourier series; hydrodynamics; semiconductor device models; Boltzmann transport equation; Fourier series expansion; frequency domain; global modeling simulator; hydrodynamic formulation; semiconductor devices modeling; space-domain polynomial expansion; spatial expansion method; Equations; Finite difference methods; Fourier series; Frequency domain analysis; High-K gate dielectrics; Hydrodynamics; Numerical models; Polynomials; Sampling methods; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European
Conference_Location :
Amsterdam
Print_ISBN :
978-2-87487-007-1
Type :
conf
DOI :
10.1109/EMICC.2008.4772302
Filename :
4772302
Link To Document :
بازگشت