Broadband Scanning Microwave Microscopy investigation of graphene

Author

Fabiani, Silvia ; Mencarelli, Davide ; Donato, Andrea Di ; Monti, Tamara ; Venanzoni, Giuseppe ; Morini, Antonio ; Rozzi, Tullio ; Farina, Marco

Author_Institution

DIBET, Univ. Politec. delle Marche, Ancona, Italy

fYear

2011

fDate

5-10 June 2011

Firstpage

1

Lastpage

4

Abstract

In this work we describe the application of a dual-channel scanning probe microscope performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) - developed by ourselves- to a graphene flake. In our system we introduce a conversion in Time-Domain to discriminate the desired information, achieving high quality microwave images with nanometric resolution. The graphene sample is deposited on a substrate of SiO₂ with an additional deposition of gold (a contact finger). The preliminary measurements seem to show evidence of localized change of impedance near the edge of the flake.

Keywords

graphene; microwave imaging; scanning probe microscopy; scanning tunnelling microscopy; C; STM; SiO₂-Au; broadband scanning microwave microscopy; dual-channel scanning probe microscopy; graphene flake; high quality microwave imaging; nanometric resolution; scanning tunneling microscopy; wide-band near field scanning microwave microscopy; Broadband communication; Frequency measurement; Impedance; Microscopy; Microwave imaging; Microwave theory and techniques; Transmission line measurements; Microwave Imaging; Microwave Measurement; Nanotechnology; Scanning Probe Microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International

Conference_Location

Baltimore, MD

ISSN

0149-645X

Print_ISBN

978-1-61284-754-2

Electronic_ISBN

0149-645X

Type

conf

DOI

10.1109/MWSYM.2011.5972890

Filename

5972890