Title :
Broadband Scanning Microwave Microscopy investigation of graphene
Author :
Fabiani, Silvia ; Mencarelli, Davide ; Donato, Andrea Di ; Monti, Tamara ; Venanzoni, Giuseppe ; Morini, Antonio ; Rozzi, Tullio ; Farina, Marco
Author_Institution :
DIBET, Univ. Politec. delle Marche, Ancona, Italy
Abstract :
In this work we describe the application of a dual-channel scanning probe microscope performing simultaneously Scanning Tunneling Microscopy (STM) and wide-band Near Field Scanning Microwave Microscopy (wide-band SMM) - developed by ourselves- to a graphene flake. In our system we introduce a conversion in Time-Domain to discriminate the desired information, achieving high quality microwave images with nanometric resolution. The graphene sample is deposited on a substrate of SiO2 with an additional deposition of gold (a contact finger). The preliminary measurements seem to show evidence of localized change of impedance near the edge of the flake.
Keywords :
graphene; microwave imaging; scanning probe microscopy; scanning tunnelling microscopy; C; STM; SiO2-Au; broadband scanning microwave microscopy; dual-channel scanning probe microscopy; graphene flake; high quality microwave imaging; nanometric resolution; scanning tunneling microscopy; wide-band near field scanning microwave microscopy; Broadband communication; Frequency measurement; Impedance; Microscopy; Microwave imaging; Microwave theory and techniques; Transmission line measurements; Microwave Imaging; Microwave Measurement; Nanotechnology; Scanning Probe Microscopy;
Conference_Titel :
Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-61284-754-2
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2011.5972890
