Optimising test sets for a low noise amplifier with a defect-oriented approach

Author

Kheriji, R. ; Danelon, V. ; Carbonero, J.L. ; Mir, S.

Author_Institution

ST Microelectron., Crolles, France

fYear

2005

fDate

7-11 March 2005

Firstpage

170

Abstract

This paper is aimed at studying defect-oriented test techniques for RF components in order to optimize production test sets. This study is mandatory for the definition of an efficient test flow strategy. We have carried out a fault simulation campaign for a low-noise amplifier (LNA) for reducing a test set while maintaining high fault coverage. The set of production test measurements should include low-cost structural tests such as simple current consumption and only a few more sophisticated tests, dedicated to functional specifications, such as S parameters, noise figure (NF) or IP3.

Keywords

S-parameters; fault simulation; integrated circuit testing; optimisation; production testing; radiofrequency amplifiers; 400 MHz to 4 GHz; BiCMOS low noise amplifier; IP3; LNA; RF component test; S parameters; current consumption testing; defect-oriented test techniques; fault coverage; fault simulation; low-cost structural tests; noise figure; production test measurements; test flow strategy; test set optimisation; test set reduction; Circuit faults; Circuit testing; Costs; Current measurement; Low-noise amplifiers; Microelectronics; Noise measurement; Production; Radio frequency; Resistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe, 2005. Proceedings

ISSN

1530-1591

Print_ISBN

0-7695-2288-2

Type

conf

DOI

10.1109/DATE.2005.233

Filename

1395549