IEEE 1149.4 compatible ABMs for basic RF measurements [analogue boundary modules]

Author

Syri, Pekka ; Hakkinen, Juha ; Moilanen, Markku

Author_Institution

Dept. of Electr. & Inf. Eng., Oulu Univ., Finland

fYear

2005

fDate

7-11 March 2005

Firstpage

172

Abstract

An analogue testing standard IEEE 1149.4 is mainly targeted for low-frequency testing. The problem studied in this paper is extending the standard also for radio frequency testing. IEEE 1149.4 compatible measurement structures (ABMs) developed in this study extract the information one is measuring from the radio frequency signal and represent the result as a DC voltage level. The ABMs presented in this paper are targeted for power and frequency measurements operating in frequencies from 1 GHz to 2 GHz. The power measurement error caused by temperature, supply voltage and process variations is roughly 2 dB and the frequency measurement error is 0.1 GHz, respectively.

Keywords

frequency measurement; integrated circuit testing; measurement errors; power measurement; 1 to 2 GHz; IEEE 1149.4 compatible ABM; RF frequency measurements; RF power measurements; analogue boundary modules; analogue testing standard; measurement errors; process variations; radio frequency testing; supply voltage induced errors; temperature induced errors; Circuit testing; Detectors; Electronic equipment testing; Frequency measurement; Measurement standards; Power measurement; RF signals; Radio frequency; Signal processing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe, 2005. Proceedings

ISSN

1530-1591

Print_ISBN

0-7695-2288-2

Type

conf

DOI

10.1109/DATE.2005.178

Filename

1395550