Title :
Experimental Study of Ground Plane Width Effect in Multilayer MCM CPW Lines
Author :
Samanta, K.K. ; Robertson, I.D.
Author_Institution :
Sch. of Electron. & Electr. Eng., Univ. of Leeds, Leeds
Abstract :
This paper describes the accurate characterization and detailed experimental study of ground width of multilayer CPW lines up to 110 GHz fabricated using photoimageable thick film technology for MCM applications. Further, the effective dielectric constant and characteristic impedance are extracted from the measured S-parameters by conversion to ABCD parameters to investigate the practical effect of ground plane width on a multilayer CPW.
Keywords :
S-parameters; coplanar waveguides; multichip modules; ABCD parameters; S-parameters; characteristic impedance; coplanar waveguide; effective dielectric constant; frequency 110 GHz; ground plane width effect; multichip modules; multilayer MCM CPW lines; photoimageable thick film technology; Circuits; Conductors; Coplanar waveguides; Dielectric constant; Dielectric losses; Dielectric measurements; Dielectric substrates; Electromagnetic heating; Nonhomogeneous media; Scattering parameters;
Conference_Titel :
Microwave Integrated Circuit Conference, 2008. EuMIC 2008. European
Conference_Location :
Amsterdam
Print_ISBN :
978-2-87487-007-1
DOI :
10.1109/EMICC.2008.4772314
