• DocumentCode
    2586842
  • Title

    Dynamic and static responses of a piezoelectric actuator at nanometer scale elongations

  • Author

    Bonnail, N. ; Tonneau, D. ; Capolino, J.A. ; Dallaporta, H.

  • Author_Institution
    Dept. de Phys., Faculte des Sci. de Luminy, Marseille, France
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    293
  • Abstract
    The need of linear displacements in the nanometer range leads to the use of piezoelectric actuators in nanotechnology equipment. The aim of this paper is to present a new procedure to characterize a piezoelectric actuator at low excitation level corresponding to elongation at nanometer scale, in a scanning tunneling microscope. It is shown that the actuator dilatation is estimated using the tunnel current between a sharp tip fixed to the actuator and a metallic surface as a displacement sensor, and computing indirectly the unknown elongation from the physical constants of the metal under test in a theoretical law. Then, the actuator output elongation to input voltage signals is measured, via the tunnel current, to evaluate static and dynamic responses of the actuator. The proposed procedure will be used to obtain the input-output actuator model in order to implement its control
  • Keywords
    dynamic response; elongation; nanotechnology; piezoelectric actuators; scanning electron microscopes; actuator dilatation estimation; actuator output elongation; displacement sensor; dynamic response; input voltage signals; input-output actuator model; linear displacements; low excitation level; metallic surface; nanometer scale elongations; nanotechnology equipment; piezoelectric actuator; scanning tunneling microscope; sharp tip; static response; tunnel current; Atomic force microscopy; Atomic measurements; Electrical equipment industry; Nanotechnology; Piezoelectric actuators; Scanning probe microscopy; Surface topography; Testing; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
  • Conference_Location
    Rome
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-6401-5
  • Type

    conf

  • DOI
    10.1109/IAS.2000.881126
  • Filename
    881126