• DocumentCode
    2587581
  • Title

    Study of the impact of hardware fault on software reliability

  • Author

    Huang, Bing ; Li, Xiaojun ; Li, Ming ; Bernstein, Joseph ; Smidts, Carol

  • Author_Institution
    Center for Reliability Eng., Maryland Univ., College Park, MD
  • fYear
    2005
  • fDate
    1-1 Nov. 2005
  • Lastpage
    72
  • Abstract
    As software plays increasingly important roles in modern society, reliable software becomes desirable for all stakeholders. One of the root causes of software failure is the failure of the computer hardware platform on which the software resides. Traditionally, fault injection has been utilized to study the impact of these hardware failures. One issue raised with respect to the use of fault injection is the lack of prior knowledge on the faults injected, and the fact that, as a consequence, the failures observed may not represent actual operational failures. This paper proposes a simulation-based approach to explore the distribution of hardware failures caused by three primary failure mechanisms intrinsic to semiconductor devices. A dynamic failure probability for each hardware unit is calculated. This method is applied to an example Z80 system and two software segments. The results lead to the conclusion that the hardware failure profile is location related, time dependent, and software-specific
  • Keywords
    failure analysis; fault diagnosis; probability; software fault tolerance; Z80 system; dynamic failure probability; fault injection; hardware failure; hardware fault; semiconductor devices; software failure; software reliability; Communication system software; Fault location; Hardware; Registers; Relays; Reliability engineering; Software reliability; Software safety; Software systems; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 2005. ISSRE 2005. 16th IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1071-9458
  • Print_ISBN
    0-7695-2482-6
  • Type

    conf

  • DOI
    10.1109/ISSRE.2005.39
  • Filename
    1544722