Title :
Low delay-variation sub-/near-threshold asynchronous-to-synchronous interface controller for GALS Network-on-Chips
Author :
Weng-Geng Ho ; Kwen-Siong Chong ; Bah-Hwee Gwee ; Chang, Joseph S.
Author_Institution :
Nanyang Technol. Univ., Singapore, Singapore
Abstract :
We propose an Asynchronous-to-Synchronous Interface Controller (A2S-IC) with low delay-variation towards Process, Voltage and Temperature (PVT) variations for sub-threshold/near-threshold operation in low power applications. This A2S-IC is targeted for a full-range Dynamic Voltage Scaling (DVS) Global-Asynchronous-Local-Synchronous (GALS) Network-on-Chip (NoC). There are three key attributes in this proposed A2S-IC. First, it is realized using static-logic (over dynamic-logic), hence is more appropriate for DVS (and sub-threshold operation). Second, it is implemented using gate-level standard-cell to simplify the implementation efforts. Third, it is designed to share some internal nodes, hence reducing the redundant switching for data validity checking. The proposed A2S-IC is compared against its reported dynamic-logic counterpart; both are implemented in the same 65nm CMOS process. Based on the simulations conducted at 27 C, our proposed A2S-IC is more throughput-efficient at near- and sub-threshold operations, featuring ~19% and ~66% faster throughput at FDD =0.5V and FDD =0.3V respectively. When the temperature variation (0°C to 100°C) is considered at the sub-threshold operation, the proposed A2S-IC demonstrates 140% faster throughput than the reported design, the former only features up to 1.6x delay-variation but the latter exhibits up to 4x delay-variation. The proposed A2S-IC is able to operate at the voltage as low as 0.15V (as opposed to 0.3V for the reported design).
Keywords :
CMOS logic circuits; logic circuits; logic design; network-on-chip; A2S-IC; CMOS process; DVS; GALS NoC; PVT; asynchronous-to-synchronous interface controller; data validity checking; dynamic voltage scaling; global-asynchronous-local-synchronous; low delay-variation; near-threshold operation; network-on-chips; process voltage and temperature; redundant switching; size 65 nm; static-logic; subthreshold operation; Clocks; Delays; Generators; Logic gates; Pipelines; Synchronization; Throughput;
Conference_Titel :
Circuits and Systems (APCCAS), 2014 IEEE Asia Pacific Conference on
Conference_Location :
Ishigaki
DOI :
10.1109/APCCAS.2014.7032705