Title :
Smart temperature sensor for thermal testing of cell-based ICs
Author :
Bota, S.A. ; Rosales, M. ; Rosselló, J.L. ; Segura, J.
Author_Institution :
Grup de Tecnologia Electronica, Univ. de les Illes Baleares, Palma de Mallorca, Spain
Abstract :
In this paper we present a simple and efficient built-in temperature sensor for thermal monitoring of standard-cell based VLSI circuits. The proposed smart temperature sensor uses a ring-oscillator composed of complex gates instead of inverters to optimize their linearity. Simulation results from a 0.18-μm CMOS technology show that the nonlinearity error of the sensor can be reduced when an adequate set of standard logic gates is selected.
Keywords :
CMOS logic circuits; VLSI; circuit optimisation; intelligent sensors; logic gates; logic testing; oscillators; temperature sensors; 0.18 micron; CMOS technology; built-in temperature sensor; cell-based IC; complex gates; linearity optimization; nonlinearity error; ring oscillator; smart temperature sensor; standard logic gates; standard-cell based VLSI circuits; thermal monitoring; thermal testing; CMOS logic circuits; CMOS technology; Circuit simulation; Circuit testing; Intelligent sensors; Inverters; Linearity; Monitoring; Temperature sensors; Very large scale integration;
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Print_ISBN :
0-7695-2288-2
DOI :
10.1109/DATE.2005.271
