DocumentCode
2588081
Title
Smart temperature sensor for thermal testing of cell-based ICs
Author
Bota, S.A. ; Rosales, M. ; Rosselló, J.L. ; Segura, J.
Author_Institution
Grup de Tecnologia Electronica, Univ. de les Illes Baleares, Palma de Mallorca, Spain
fYear
2005
fDate
7-11 March 2005
Firstpage
464
Abstract
In this paper we present a simple and efficient built-in temperature sensor for thermal monitoring of standard-cell based VLSI circuits. The proposed smart temperature sensor uses a ring-oscillator composed of complex gates instead of inverters to optimize their linearity. Simulation results from a 0.18-μm CMOS technology show that the nonlinearity error of the sensor can be reduced when an adequate set of standard logic gates is selected.
Keywords
CMOS logic circuits; VLSI; circuit optimisation; intelligent sensors; logic gates; logic testing; oscillators; temperature sensors; 0.18 micron; CMOS technology; built-in temperature sensor; cell-based IC; complex gates; linearity optimization; nonlinearity error; ring oscillator; smart temperature sensor; standard logic gates; standard-cell based VLSI circuits; thermal monitoring; thermal testing; CMOS logic circuits; CMOS technology; Circuit simulation; Circuit testing; Intelligent sensors; Inverters; Linearity; Monitoring; Temperature sensors; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2005. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2288-2
Type
conf
DOI
10.1109/DATE.2005.271
Filename
1395606
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