RF Characterization of Multi-walled carbon nanotube and ZnO film

Author

Choi, Jung Han ; Song, Insang ; Cho, Joon Hyong ; Kim, Whankyun ; Yoon, Hyongseo ; Jun, Seong Chan

Author_Institution

Samsung Electron., Yongin, South Korea

fYear

2011

fDate

5-10 June 2011

Firstpage

1

Lastpage

4

Abstract

Growing interests on carbon nanotubes (CNTs) and ZnO film let us consider radio frequency characteristics for future employment in electronic devices. Prior to the deployment and development for RF devices, the fundamentals about two materials are investigated. Multi-walled CNTs are characterized up to 50 GHz. Using the measured S-parameters Telegrapher´s equivalent circuit models are extracted. And, for the ZnO film the equivalent circuit parameters are obtained as well. The circuit parameters provide the useful criterion to evaluate RF performance.

Keywords

II-VI semiconductors; S-parameters; carbon nanotubes; equivalent circuits; semiconductor thin films; zinc compounds; RF characterization; RF devices; S-parameters; ZnO; circuit parameters; electronic devices; multiwalled carbon nanotube; radio frequency characteristics; telegrapher´s equivalent circuit models; Films; Performance evaluation; Probes; Radio frequency; Zinc oxide; Telegrapher; ZnO; carbon nanotubes (CNTs);

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest (MTT), 2011 IEEE MTT-S International

Conference_Location

Baltimore, MD

ISSN

0149-645X

Print_ISBN

978-1-61284-754-2

Electronic_ISBN

0149-645X

Type

conf

DOI

10.1109/MWSYM.2011.5972973

Filename

5972973