DocumentCode :
2588542
Title :
The design and test of a smartcard chip using a CHAIN self-timed network-on-chip
Author :
Bainbridge, W.J. ; Plana, L.A. ; Furber, S.B.
Author_Institution :
Dept. of Comput. Sci., Manchester Univ., UK
Volume :
3
fYear :
2004
fDate :
16-20 Feb. 2004
Firstpage :
274
Abstract :
The CHAIN self-timed network-on-chip (NoC) architecture provides a flexible, clock-independent solution to the problems of system-on-chip (SoC) interconnect. In this paper we look at the use of CHAIN in a low-performance, smartcard chip to connect two self-timed processors and a range of memories and peripherals. Key design-time advantages provided by the use of CHAIN in this design included the ability to operate a very-narrow, high-frequency network fabric using serial communication without the need for high frequency clocking, rapid assembly in the final stages of the design and the avoidance of the need to perform timing analysis or validation on the SoC interconnect. Additionally we describe a bare port that provided direct access to the CHAIN fabric which was instrumental in testing and debugging the smartcard chip.
Keywords :
integrated circuit design; integrated circuit interconnections; integrated circuit testing; network interfaces; system-on-chip; SOC interconnect; clock independent solution; high frequency clocking; high frequency network fabric; self timed network on chip; self timed processors; serial communication; smartcard chip debugging; smartcard chip design; smartcard chip test; system-on-chip; timing analysis; Assembly; Automatic testing; Clocks; Fabrics; Frequency; Instruments; Network-on-a-chip; Performance analysis; System-on-a-chip; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2085-5
Type :
conf
DOI :
10.1109/DATE.2004.1269249
Filename :
1269249
Link To Document :
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