DocumentCode
2588542
Title
The design and test of a smartcard chip using a CHAIN self-timed network-on-chip
Author
Bainbridge, W.J. ; Plana, L.A. ; Furber, S.B.
Author_Institution
Dept. of Comput. Sci., Manchester Univ., UK
Volume
3
fYear
2004
fDate
16-20 Feb. 2004
Firstpage
274
Abstract
The CHAIN self-timed network-on-chip (NoC) architecture provides a flexible, clock-independent solution to the problems of system-on-chip (SoC) interconnect. In this paper we look at the use of CHAIN in a low-performance, smartcard chip to connect two self-timed processors and a range of memories and peripherals. Key design-time advantages provided by the use of CHAIN in this design included the ability to operate a very-narrow, high-frequency network fabric using serial communication without the need for high frequency clocking, rapid assembly in the final stages of the design and the avoidance of the need to perform timing analysis or validation on the SoC interconnect. Additionally we describe a bare port that provided direct access to the CHAIN fabric which was instrumental in testing and debugging the smartcard chip.
Keywords
integrated circuit design; integrated circuit interconnections; integrated circuit testing; network interfaces; system-on-chip; SOC interconnect; clock independent solution; high frequency clocking; high frequency network fabric; self timed network on chip; self timed processors; serial communication; smartcard chip debugging; smartcard chip design; smartcard chip test; system-on-chip; timing analysis; Assembly; Automatic testing; Clocks; Fabrics; Frequency; Instruments; Network-on-a-chip; Performance analysis; System-on-a-chip; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2085-5
Type
conf
DOI
10.1109/DATE.2004.1269249
Filename
1269249
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