DocumentCode :
2588612
Title :
Qualification and integration of complex I/O in SoC design flows
Author :
Abraham, Jay ; Rao, Guruprasad
Author_Institution :
Silicon Correlation Div., Magma Design Autom., Santa Clara, CA, USA
Volume :
3
fYear :
2004
fDate :
16-20 Feb. 2004
Firstpage :
286
Abstract :
Low power, high speed, and reduced cost requirements force integration of specialized Intellectual Property (IP) like complex I/O blocks on a system on chip (SoC). Today designers have access to a variety of specialized IP blocks and cells for use in SoC design flows. Complex I/O appear in a myriad of standards such as USB 1.0/1.1/2.0, IEEE 1394 a/b (firewire), SSTL, HSTL, PCl-X, LVDS, and more. These new standards are driven by consumer´s demand for bandwidth and capability, and the industry´s desire to reuse proven design blocks in vastly different applications and domains. Integration of these specialized IP blocks introduces increased complexity to design flows. For example, digital designs must now consider the analog like properties of some complex I/O. This paper discusses the uniqueness of embedding complex I/O in a SoC. The features and properties that differentiate complex I/O from standard design practices will be described. Finally methodologies for characterizing and building accurate digital abstractions of I/O will be presented.
Keywords :
nanotechnology; system-on-chip; SoC design flows; complex I/O design; complex input/output design; digital design; intellectual property integration; nanotechnology; system on chip design flows; Costs; Design automation; Energy consumption; Failure analysis; Firewire; Leakage current; Performance analysis; Qualifications; Silicon; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2085-5
Type :
conf
DOI :
10.1109/DATE.2004.1269252
Filename :
1269252
Link To Document :
بازگشت