Title :
Building the hierarchy from a flat netlist for a fast and accurate post-layout simulation with parasitic components
Author :
Daglio, Pierluigi ; Iezzi, David ; Rimondi, Danilo ; Roma, Carlo ; Santapa, Salvatore
Author_Institution :
STMicroelectron., Milan, Italy
Abstract :
Main concerns related to post-layout simulation, today, are about the format of the netlist coming out from the parasitic extractor. In fact, such a netlist is usually flat so that readability, whether compared to the pre-layout hierarchical one, is very poor due to device and net names which often change and to the difficulty to compare pre-layout and post-layout output signals. Furthermore, simulating such large flat netlists is frequently time consuming because it is not possible to exploit algorithms like hierarchical array reduction (HAR) and isomorphic matching (IM), strength points of state-of-the-art full chip simulators. In this paper, we present a new approach that, starting from a flat netlist with parasitic components and a pre-layout hierarchical one, allows to create a fully hierarchical post-layout netlist containing device parameters and parasitic components directly extracted from the layout. In this way, a fast and accurate post-layout simulation is made possible by the use of look-up table simulators, taking advantages from the HAR and IM algorithms as mentioned before. This methodology has been integrated in a complete design flow to guarantee first silicon success, cut down time-to-design, improve time-to-market and streamline design quality.
Keywords :
SPICE; circuit simulation; table lookup; SPICE; design flow; flat netlist; hierarchical array reduction; hierarchical postlayout netlist; isomorphic matching; lookup table simulators; parasitic extractor; post layout simulation; postlayout output signals; prelayout output signals; simulation program with integrated circuit emphasis; state of the art full chip simulators; time consuming; Automatic testing; Buildings; Charge measurement; Charge pumps; Circuit simulation; Current measurement; Design automation; Silicon; Table lookup; Voltage;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2004. Proceedings
Print_ISBN :
0-7695-2085-5
DOI :
10.1109/DATE.2004.1269268