DocumentCode
2588946
Title
Phase and amplitude modulation noise metrology
Author
Nelson, Craig
Author_Institution
NIST Boulder, USA
fYear
2009
fDate
20-24 April 2009
Abstract
Noise is everywhere. Its ubiquitous nature interferes with or masks desired signals and fundamentally limits all electronic measurements. Noise in the presence of a carrier is experienced as amplitude and phase modulation noise. Modulation noise will be covered from its theory, to its origins and consequences. The effects of signal manipulation such as amplification, frequency translation and multiplication on spectral purity are examined. Practical techniques for measuring AM and PM noise, from the simple to complex will be discussed. Calibration of measurements and common problems and pitfall will also be covered.
Keywords
Amplitude modulation; Metrology; NIST; Noise generators; Noise level; Optical filters; Optical noise; Optical sensors; Optical variables control; Phase noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 2009 Joint with the 22nd European Frequency and Time forum. IEEE International
Conference_Location
Besancon, France
ISSN
1075-6787
Print_ISBN
978-1-4244-3511-1
Electronic_ISBN
1075-6787
Type
conf
DOI
10.1109/FREQ.2009.5168115
Filename
5168115
Link To Document