• DocumentCode
    2589025
  • Title

    SAR Imaging Simulation for an Inhomogeneous Undulated Lunar Surface Based on Triangulated Irregular Network

  • Author

    Jin, Ya-Qiu ; Fa, Wenzhe ; Xu, Feng

  • Author_Institution
    Key Lab. of Wave Scattering & Remote Sensing Inf., Fudan Univ., Shanghai
  • fYear
    2008
  • fDate
    10-12 Sept. 2008
  • Firstpage
    333
  • Lastpage
    336
  • Abstract
    Based on the statistics of the lunar cratered terrain, e.g. population, dimension and shape of craters, the terrain feature of cratered lunar surface is numerically generated. According to inhomogeneous distribution of the lunar surface slope, the triangulated irregular network is employed to make the digital elevation of lunar surface model. The Kirchhoff approximation of rough surface scattering is then applied to simulation of lunar surface scattering. The synthetic aperture radar (SAR) image for comprehensive cratered lunar surfaces is numerically generated. Making use of the digital elevation and Clementine UVVIS data at Apollo 15 landing site as the ground truth, an SAR image at Apollo 15 landing site is simulated.
  • Keywords
    digital elevation models; lunar surface; radar imaging; radioastronomical techniques; rough surfaces; spaceborne radar; synthetic aperture radar; terrain mapping; Apollo 15 landing site; Clementine UVVIS data; Kirchhoff approximation; SAR imaging simulation; digital elevation; inhomogeneous undulated lunar surface; lunar cratered terrain; lunar surface model; lunar surface scattering; lunar surface slope; rough surface scattering; synthetic aperture radar; triangulated irregular network; Moon; Radar polarimetry; Radar scattering; Rough surfaces; Shape; Spaceborne radar; Statistics; Surface morphology; Surface roughness; Surface topography; Back Projection (BP); SAR imaging; Triangulated Irregular Network (TIN); cratered terrain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2008 China-Japan Joint
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-3821-1
  • Type

    conf

  • DOI
    10.1109/CJMW.2008.4772438
  • Filename
    4772438