DocumentCode :
2589444
Title :
An efficiently preconditioned GMRES method for fast parasitic-sensitive deep-submicron VLSI circuit simulation
Author :
Li, Zhao ; Shi, C. J Richard
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
fYear :
2005
fDate :
7-11 March 2005
Firstpage :
752
Abstract :
We propose an efficiently preconditioned generalized minimal residual (GMRES) method for fast SPICE-accurate transient simulation of parasitic-sensitive deep-submicron VLSI circuits. First, when time step-sizes vary within a predefined range, the preconditioned GMRES method is applied to solve circuit matrix equations rather than LU factorization. The preconditioner we use comes directly from the previously factorized L and U matrices. Second, to keep using the same preconditioner during nonlinear iteration, the successive variable chord method is applied as an alternative to the Newton-Raphson method. An improved piecewise weakly nonlinear definition of MOSFET is adopted and the low-rank update technique is implemented to refresh the preconditioner efficiently. With these techniques, the number of required LU factorizations during transient simulation is reduced dramatically. Experimental results on power/ground networks have demonstrated that the proposed method yields SPICE-like accuracy with an about 18× overall CPU time speedup over SPICE3 for circuits with tens of thousands elements.
Keywords :
MOS integrated circuits; MOSFET; VLSI; circuit simulation; iterative methods; matrix decomposition; GMRES method; LU factorizations; MOSFET; SPICE-accurate transient simulation; circuit matrix equations; deep-submicron VLSI; generalized minimal residual method; low-rank update technique; nonlinear iteration; parasitic-sensitive circuit simulation; piecewise weakly nonlinear definition; power/ground networks; preconditioned GMRES method; successive variable chord method; time step-sizes; transient simulation; Circuit simulation; Costs; Coupling circuits; Large-scale systems; Nonlinear circuits; Nonlinear equations; SPICE; Stability; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2288-2
Type :
conf
DOI :
10.1109/DATE.2005.57
Filename :
1395668
Link To Document :
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