DocumentCode
2589538
Title
New international standards on reliability growth
Author
Crow, Larry H.
Author_Institution
AT&T Bell Lab., Whippany, NJ, USA
fYear
1991
fDate
29-31 Jan 1991
Firstpage
478
Lastpage
480
Abstract
A review is presented of two international standards on reliability growth developed by the International Electrotechnical Commission (IEC) for world trade. The first IEC standard discussed is IEC 1014, Programmes for Reliability Growth, and the second IEC standard discussed is IEC 56 (Central Office) 150 Reliability Growth Models and Estimation Methods. IEC 1014 was issued as an international standard in 1989 and IEC56 (Central Office) 150 is an approved Draft International Standard. These standards cover the management and modeling aspects, respectively, of a reliability growth program. An overview of these documents is given, together with a more detailed discussion of various reliability growth terminology, procedures, and models presented in these international standards
Keywords
reliability; standards; IEC 1014; IEC 56; International Electrotechnical Commission; international standards; reliability growth; Guidelines; IEC standards; Power system modeling; Power system reliability; Reliability engineering; Software standards; Standards development; Standards publication; System testing; Terminology;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium, 1991. Proceedings., Annual
Conference_Location
Orlando, FL
Print_ISBN
0-87942-661-6
Type
conf
DOI
10.1109/ARMS.1991.154483
Filename
154483
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