• DocumentCode
    2589538
  • Title

    New international standards on reliability growth

  • Author

    Crow, Larry H.

  • Author_Institution
    AT&T Bell Lab., Whippany, NJ, USA
  • fYear
    1991
  • fDate
    29-31 Jan 1991
  • Firstpage
    478
  • Lastpage
    480
  • Abstract
    A review is presented of two international standards on reliability growth developed by the International Electrotechnical Commission (IEC) for world trade. The first IEC standard discussed is IEC 1014, Programmes for Reliability Growth, and the second IEC standard discussed is IEC 56 (Central Office) 150 Reliability Growth Models and Estimation Methods. IEC 1014 was issued as an international standard in 1989 and IEC56 (Central Office) 150 is an approved Draft International Standard. These standards cover the management and modeling aspects, respectively, of a reliability growth program. An overview of these documents is given, together with a more detailed discussion of various reliability growth terminology, procedures, and models presented in these international standards
  • Keywords
    reliability; standards; IEC 1014; IEC 56; International Electrotechnical Commission; international standards; reliability growth; Guidelines; IEC standards; Power system modeling; Power system reliability; Reliability engineering; Software standards; Standards development; Standards publication; System testing; Terminology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1991. Proceedings., Annual
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-87942-661-6
  • Type

    conf

  • DOI
    10.1109/ARMS.1991.154483
  • Filename
    154483