DocumentCode :
2589741
Title :
Physics of Resistor Failure
Author :
Lewis, Chales W. ; Bohrer, John J.
Author_Institution :
International Resistance Company, Philadelphia 8, Pennsylvania
fYear :
1962
fDate :
Sept. 1962
Firstpage :
11
Lastpage :
19
Keywords :
Electrical resistance measurement; Electrons; Manufacturing; Material storage; Oxidation; Physics; Protection; Resistors; Stability; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location :
Chicago, IL, USA
ISSN :
0097-2088
Type :
conf
DOI :
10.1109/IRPS.1962.359980
Filename :
4201986
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2589741
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