DocumentCode

2589741

Title

Physics of Resistor Failure

Author

Lewis, Chales W. ; Bohrer, John J.

Author_Institution

International Resistance Company, Philadelphia 8, Pennsylvania

fYear

1962

fDate

Sept. 1962

Firstpage

11

Lastpage

19

Keywords

Electrical resistance measurement; Electrons; Manufacturing; Material storage; Oxidation; Physics; Protection; Resistors; Stability; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1962. First Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

conf

DOI

10.1109/IRPS.1962.359980

Filename

4201986