DocumentCode

2589856

Title

Diagnostic Techniques in Semiconductor Device Stress Response Analysis

Author

Zierdt, Conrad H.

Author_Institution

General Electric Company, Semiconductor Products Department, Syracuse, New York

fYear

1962

fDate

Sept. 1962

Firstpage

91

Lastpage

97

Keywords

Atmosphere; Automobiles; Failure analysis; History; Mechanical systems; Modems; Physics; Semiconductor devices; Stress; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1962. First Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

conf

DOI

10.1109/IRPS.1962.359986

Filename

4201992