Title :
Diagnostic Techniques in Semiconductor Device Stress Response Analysis
Author :
Zierdt, Conrad H.
Author_Institution :
General Electric Company, Semiconductor Products Department, Syracuse, New York
Keywords :
Atmosphere; Automobiles; Failure analysis; History; Mechanical systems; Modems; Physics; Semiconductor devices; Stress; Testing;
Conference_Titel :
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/IRPS.1962.359986
