DocumentCode
2589876
Title
The Effects of High Energy Radiation on Failure Mechanisms in Semiconductors Devices
Author
Honnold, V.R. ; Schoch, C.B.
Author_Institution
Hughes Aircraft Company, Fullerton, California
fYear
1962
fDate
Sept. 1962
Firstpage
99
Lastpage
103
Keywords
Failure analysis; Gamma rays; Insulation; Ionization; Ionizing radiation; Physics; Production; Semiconductor devices; Semiconductor diodes; Semiconductor materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location
Chicago, IL, USA
ISSN
0097-2088
Type
conf
DOI
10.1109/IRPS.1962.359987
Filename
4201993
Link To Document