DocumentCode
2589956
Title
Dislocations and Semiconductor Device Failure
Author
Queisser, H.J.
Author_Institution
Shockley Transistor, Unit of Clevite Transistor, Palo Alto, California
fYear
1962
fDate
Sept. 1962
Firstpage
146
Lastpage
155
Keywords
Crystalline materials; Crystallization; Lattices; Photovoltaic cells; Piezoelectric materials; Semiconductor device reliability; Semiconductor devices; Semiconductor diodes; Semiconductor materials; Silicon devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location
Chicago, IL, USA
ISSN
0097-2088
Type
conf
DOI
10.1109/IRPS.1962.359991
Filename
4201997
Link To Document