DocumentCode :
2589956
Title :
Dislocations and Semiconductor Device Failure
Author :
Queisser, H.J.
Author_Institution :
Shockley Transistor, Unit of Clevite Transistor, Palo Alto, California
fYear :
1962
fDate :
Sept. 1962
Firstpage :
146
Lastpage :
155
Keywords :
Crystalline materials; Crystallization; Lattices; Photovoltaic cells; Piezoelectric materials; Semiconductor device reliability; Semiconductor devices; Semiconductor diodes; Semiconductor materials; Silicon devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics of Failure in Electronics, 1962. First Annual Symposium on the
Conference_Location :
Chicago, IL, USA
ISSN :
0097-2088
Type :
conf
DOI :
10.1109/IRPS.1962.359991
Filename :
4201997
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2589956
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