Title :
New schemes for self-testing RAM
Author :
Bodean, Gh ; Bodean, D. ; Labunetz, A.
Author_Institution :
Tech. Univ. of Moldova, Kishinau, Moldova
Abstract :
This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing a wide type of random access memories (RAM): bit-or word-oriented and single- or dual-port RAM. An essential particularity of the proposed methodology is the emulation of a linear automaton over Galois field by memory own components.
Keywords :
Galois fields; logic testing; random-access storage; Galois field; PRT; RAM self-testing; bit-oriented RAM; dual-port RAM; linear automaton emulation; memory components; pseudo-ring testing; random access memories; single-port RAM; word-oriented RAM; Algorithm design and analysis; Automata; Automatic testing; Bills of materials; Built-in self-test; Galois fields; Logic; Polynomials; Random access memory; Read-write memory;
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Print_ISBN :
0-7695-2288-2
DOI :
10.1109/DATE.2005.223
