DocumentCode

2590017

Title

Reliability Physics (The Physics of Failure)

Author

Earles, Donald R. ; Eddins, Mary F.

Author_Institution

Chief, Reliability Analysis Section

fYear

1962

fDate

Sept. 1962

Firstpage

179

Lastpage

193

Keywords

Assembly; Circuit topology; Design engineering; Failure analysis; Frequency; Mathematics; Physics; Reliability engineering; Stress; Uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics of Failure in Electronics, 1962. First Annual Symposium on the

Conference_Location

Chicago, IL, USA

ISSN

0097-2088

Type

conf

DOI

10.1109/IRPS.1962.359994

Filename

4202000