DocumentCode
2590233
Title
Testing of the ST9 Microcontroller
Author
Andretta, Francesco ; Peri, Maurizio ; Pozzi, Cesare
Author_Institution
SGS-Thomson Microelectron., Milan, Italy
fYear
1994
fDate
5-8 Sep 1994
Firstpage
322
Lastpage
328
Abstract
This paper reports the fault analysis on the CPU of the ST9 8-bit Microcontroller, essentially described to transistor-level, performed using functional and serial test patterns and a gate-level fault simulator
Keywords
computer testing; fault diagnosis; integrated circuit testing; logic testing; microcontrollers; 8 bit; CPU; ST9 Microcontroller; fault analysis; functional test patterns; gate-level fault simulator; serial test patterns; transistor-level; Central Processing Unit; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Logic circuits; Logic testing; Microcontrollers; Microelectronics; Performance evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
EUROMICRO 94. System Architecture and Integration. Proceedings of the 20th EUROMICRO Conference.
Conference_Location
Liverpool
Print_ISBN
0-8186-6430-4
Type
conf
DOI
10.1109/EURMIC.1994.390377
Filename
390377
Link To Document