Title :
Testing of the ST9 Microcontroller
Author :
Andretta, Francesco ; Peri, Maurizio ; Pozzi, Cesare
Author_Institution :
SGS-Thomson Microelectron., Milan, Italy
Abstract :
This paper reports the fault analysis on the CPU of the ST9 8-bit Microcontroller, essentially described to transistor-level, performed using functional and serial test patterns and a gate-level fault simulator
Keywords :
computer testing; fault diagnosis; integrated circuit testing; logic testing; microcontrollers; 8 bit; CPU; ST9 Microcontroller; fault analysis; functional test patterns; gate-level fault simulator; serial test patterns; transistor-level; Central Processing Unit; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Logic circuits; Logic testing; Microcontrollers; Microelectronics; Performance evaluation;
Conference_Titel :
EUROMICRO 94. System Architecture and Integration. Proceedings of the 20th EUROMICRO Conference.
Conference_Location :
Liverpool
Print_ISBN :
0-8186-6430-4
DOI :
10.1109/EURMIC.1994.390377
