DocumentCode :
2590260
Title :
On the detection of delay faults starting from a functional description of a sequential circuit
Author :
Fummi, F.
Author_Institution :
Dept. of Electron. & Inf., Politecnico di Milano, Italy
fYear :
1994
fDate :
5-8 Sep 1994
Firstpage :
308
Lastpage :
313
Abstract :
Testing of delay faults in sequential circuits is the main topic of this paper. The proposed testing methodology exploits at first the possibility of a functional approach, thus, some relationships between a functional fault model and the gate level delay fault model are illustrated. The cooperation between a combinational test pattern generator (TPG), working at the gate level, and a functional TPG is illustrated. Such a proposed test strategy achieves the full fault coverage, as shown with a set of benchmarks
Keywords :
delays; fault diagnosis; logic testing; sequential circuits; combinational test pattern generator; delay faults detection; functional approach; functional description; gate level delay fault model; sequential circuit; Circuit faults; Circuit testing; Delay; Electrical fault detection; Fault detection; Flip-flops; Logic; Sequential analysis; Sequential circuits; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
EUROMICRO 94. System Architecture and Integration. Proceedings of the 20th EUROMICRO Conference.
Conference_Location :
Liverpool
Print_ISBN :
0-8186-6430-4
Type :
conf
DOI :
10.1109/EURMIC.1994.390379
Filename :
390379
Link To Document :
بازگشت