DocumentCode :
2590627
Title :
Stochastic power grid analysis considering process variations
Author :
Ghanta, Praveen ; Vrudhula, Sarma ; Panda, Rajendran ; Wang, Janet
Author_Institution :
Arizona Univ., Tucson, AZ, USA
fYear :
2005
fDate :
7-11 March 2005
Firstpage :
964
Abstract :
In this paper, we investigate the impact of interconnect and device process variations on voltage fluctuations in power grids. We consider random variations in the power grid´s electrical parameters as spatial stochastic processes and propose a new and efficient method to compute the stochastic voltage response of the power grid. Our approach provides an explicit analytical representation of the stochastic voltage response using orthogonal polynomials in a Hilbert space. The approach has been implemented in a prototype software called OPERA (Orthogonal Polynomial Expansions for Response Analysis). Use of OPERA on industrial power grids demonstrated speed-ups of up to two orders of magnitude. The results also show a significant variation of about ±35% in the nominal voltage drops at various nodes of the power grids and demonstrate the need for variation-aware power grid analysis.
Keywords :
CMOS integrated circuits; Hilbert spaces; circuit analysis computing; integrated circuit interconnections; integrated circuit manufacture; integrated circuit modelling; polynomials; power supply circuits; stochastic processes; CMOS circuits; Hilbert space; OPERA prototype software; Orthogonal Polynomial Expansions for Response Analysis; device process variations; electrical parameters; interconnect process variations; nominal voltage drops; orthogonal polynomials; power grid nodes; process variations; spatial stochastic processes; stochastic power grid analysis; stochastic voltage response; variation-aware power grid analysis; voltage fluctuations; Algorithm design and analysis; CMOS process; Grid computing; Integrated circuit interconnections; Leakage current; Polynomials; Power grids; Stochastic processes; Threshold voltage; Voltage fluctuations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2288-2
Type :
conf
DOI :
10.1109/DATE.2005.282
Filename :
1395712
Link To Document :
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