• DocumentCode
    2590628
  • Title

    1.05 GHz MEMS oscillator based on lateral-field-excited piezoelectric AlN resonators

  • Author

    Zuo, Chengjie ; Van der Spiegel, Jan ; Piazza, Gianluca

  • Author_Institution
    Dept. of Electr. & Syst. Eng., Univ. of Pennsylvania, Philadelphia, PA, USA
  • fYear
    2009
  • fDate
    20-24 April 2009
  • Firstpage
    381
  • Lastpage
    384
  • Abstract
    This paper reports on the first demonstration of a 1.05 GHz microelectromechanical (MEMS) oscillator based on lateral-field-excited (LFE) piezoelectric Aluminum Nitride (AlN) contour-mode resonators. The oscillator shows a phase noise level of -81 dBc/Hz at 1 kHz offset frequency and a phase noise floor of -146 dBc/Hz, which satisfies the GSM requirements of Ultra High Frequency (UHF) local oscillators (LO). The circuit was fabricated in the AMIS 0.5 mum CMOS process, with the oscillator core consuming only 3.5 mW static power. A simple two-mask process was used to fabricate the LFE AlN resonators from 843 MHz to 1.64 GHz with high Q (up to 2,200) and kt 2 (up to 1.2%). This process further relaxes manufacturing tolerances and improves yield. All these advantages make it suitable for post-CMOS integrated on-chip direct GHz frequency synthesis in reconfigurable multi-band wireless communications.
  • Keywords
    CMOS integrated circuits; UHF oscillators; micromechanical devices; piezoelectric oscillations; CMOS process; MEMS; frequency 1 kHz; frequency 1.05 GHz; frequency 1.64 GHz; frequency 843 MHz; lateral-field-excited piezoelectric aluminum nitride contour-mode resonators; microelectromechanical oscillator; power 3.5 mW; reconfigurable multi-band wireless communications; size 0.5 mum; ultra high frequency local oscillators; Aluminum nitride; Ambient intelligence; CMOS process; Circuits; Frequency; GSM; Local oscillators; Manufacturing processes; Micromechanical devices; Phase noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 2009 Joint with the 22nd European Frequency and Time forum. IEEE International
  • Conference_Location
    Besancon
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-4244-3511-1
  • Electronic_ISBN
    1075-6787
  • Type

    conf

  • DOI
    10.1109/FREQ.2009.5168205
  • Filename
    5168205