Title :
Evaluation of the Millimeter-Wave Characteristics of Dielectric Substrates by using Whispering Gallery Mode Resonators
Author :
Kogami, Yoshinori ; Shimizu, Takashi ; Osawa, Satoru ; Abe, Naoaki
Author_Institution :
Dept. of Electr. & Electron. Syst. Eng., Utsunomiya Univ., Utsunomiya
Abstract :
The Whispering-gallery mode dielectric resonator method has been developed to measure the complex permittivities of dielectric substrate materials at millimeter wave frequencies. The measurement principle, measurement apparatus, system, and some examples of measured results are presented in this manuscript.
Keywords :
dielectric resonators; millimetre wave devices; substrates; dielectric resonators; dielectric substrates; millimeter-wave characteristics; node matching; whispering gallery mode resonators; Dielectric substrates; Whispering gallery modes;
Conference_Titel :
Microwave Conference, 2008 China-Japan Joint
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3821-1
DOI :
10.1109/CJMW.2008.4772525
