DocumentCode
2590689
Title
Evaluation of the Millimeter-Wave Characteristics of Dielectric Substrates by using Whispering Gallery Mode Resonators
Author
Kogami, Yoshinori ; Shimizu, Takashi ; Osawa, Satoru ; Abe, Naoaki
Author_Institution
Dept. of Electr. & Electron. Syst. Eng., Utsunomiya Univ., Utsunomiya
fYear
2008
fDate
10-12 Sept. 2008
Firstpage
703
Lastpage
706
Abstract
The Whispering-gallery mode dielectric resonator method has been developed to measure the complex permittivities of dielectric substrate materials at millimeter wave frequencies. The measurement principle, measurement apparatus, system, and some examples of measured results are presented in this manuscript.
Keywords
dielectric resonators; millimetre wave devices; substrates; dielectric resonators; dielectric substrates; millimeter-wave characteristics; node matching; whispering gallery mode resonators; Dielectric substrates; Whispering gallery modes;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2008 China-Japan Joint
Conference_Location
Shanghai
Print_ISBN
978-1-4244-3821-1
Type
conf
DOI
10.1109/CJMW.2008.4772525
Filename
4772525
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