DocumentCode :
2590786
Title :
Does peer mentoring increase retention of the mentor?
Author :
Monte, Amy E. ; Sleeman, Kerri A. ; Hein, Gretchen L.
Author_Institution :
Michigan Technol. Univ., Houghton
fYear :
2007
fDate :
10-13 Oct. 2007
Abstract :
The Michigan Tech\´s GUIDE (graduate and undergraduate initiative for development and enhancement) and ExSEL (excelling in science and engineering learning) programs have been using peer mentoring to help retain female and underrepresented minority engineering students for over five years. Mentoring has been a successful retention strategy. Most mentoring programs measure success by looking at the retention of the mentee. This paper will address the question, "Does a peer mentoring program also increase retention of the mentor?" To demonstrate how being a peer mentor helps retain the students who are mentoring, retention data will be analyzed and anecdotal evidence will be presented. Survey results regarding how the mentoring experience has helped the mentor academically, socially and professionally will be provided. Additionally, peer mentor performance data regarding job placement, campus activities, and academic success will be examined and compared to the Michigan Tech College of Engineering (COE) average.
Keywords :
engineering education; teaching; Excelling in Science and Engineering Learning programs; Graduate and Undergraduate Initiative for Development and Enhancement; Michigan Tech; academic success; campus activities; job placement; peer mentoring; retention strategy; Best practices; Collaborative work; Data analysis; Data engineering; Educational institutions; Educational technology; Employee welfare; Engineering students; Scheduling; Seminars; Minority; Peer mentoring; Student retention; Women;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frontiers In Education Conference - Global Engineering: Knowledge Without Borders, Opportunities Without Passports, 2007. FIE '07. 37th Annual
Conference_Location :
Milwaukee, WI
ISSN :
0190-5848
Print_ISBN :
978-1-4244-1083-5
Electronic_ISBN :
0190-5848
Type :
conf
DOI :
10.1109/FIE.2007.4417950
Filename :
4417950
Link To Document :
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