• DocumentCode
    2590786
  • Title

    Does peer mentoring increase retention of the mentor?

  • Author

    Monte, Amy E. ; Sleeman, Kerri A. ; Hein, Gretchen L.

  • Author_Institution
    Michigan Technol. Univ., Houghton
  • fYear
    2007
  • fDate
    10-13 Oct. 2007
  • Abstract
    The Michigan Tech\´s GUIDE (graduate and undergraduate initiative for development and enhancement) and ExSEL (excelling in science and engineering learning) programs have been using peer mentoring to help retain female and underrepresented minority engineering students for over five years. Mentoring has been a successful retention strategy. Most mentoring programs measure success by looking at the retention of the mentee. This paper will address the question, "Does a peer mentoring program also increase retention of the mentor?" To demonstrate how being a peer mentor helps retain the students who are mentoring, retention data will be analyzed and anecdotal evidence will be presented. Survey results regarding how the mentoring experience has helped the mentor academically, socially and professionally will be provided. Additionally, peer mentor performance data regarding job placement, campus activities, and academic success will be examined and compared to the Michigan Tech College of Engineering (COE) average.
  • Keywords
    engineering education; teaching; Excelling in Science and Engineering Learning programs; Graduate and Undergraduate Initiative for Development and Enhancement; Michigan Tech; academic success; campus activities; job placement; peer mentoring; retention strategy; Best practices; Collaborative work; Data analysis; Data engineering; Educational institutions; Educational technology; Employee welfare; Engineering students; Scheduling; Seminars; Minority; Peer mentoring; Student retention; Women;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frontiers In Education Conference - Global Engineering: Knowledge Without Borders, Opportunities Without Passports, 2007. FIE '07. 37th Annual
  • Conference_Location
    Milwaukee, WI
  • ISSN
    0190-5848
  • Print_ISBN
    978-1-4244-1083-5
  • Electronic_ISBN
    0190-5848
  • Type

    conf

  • DOI
    10.1109/FIE.2007.4417950
  • Filename
    4417950