DocumentCode :
2590865
Title :
On prediction of defect rates
Author :
Vladu, Ana Maria ; Fagarasan, Ioana
Author_Institution :
Autom. Control & Comput. Sci. Fac., Politeh. Univ., Bucharest, Romania
fYear :
2012
fDate :
24-27 May 2012
Firstpage :
201
Lastpage :
205
Abstract :
The prediction of software reliability can determine the current reliability of a product, using statistical techniques based on the failures data, obtained during testing or system usability. The major problem in predicting software reliability is their high complexity, as well as the excessive limitations of existing models. Therefore, choosing the appropriate reliability prediction model is essential. The purpose of this article is to study the defect prediction models, using the Rayleigh function. This function forecasts the defect discovery rate as a function of time through the software development process. Starting from an existing static prediction model, we have introduced a new approach, using the time-scale. Also, we have considered two methods for computing the model parameters, and have compared them to the real data set. The results have validated this model as a good estimation of the defect rate behavior. We will also suggest possible directions for extending the paper in the future.
Keywords :
program testing; software maintenance; software reliability; statistical analysis; Rayleigh function; defect discovery rate; defect prediction models; defect rates; reliability prediction model; software development process; software reliability; statistical techniques; system usability; time-scale; Computational modeling; Predictive models; Programming; Software; Software reliability; Testing; defect; prediction; reliability; software development lifecycle; testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automation Quality and Testing Robotics (AQTR), 2012 IEEE International Conference on
Conference_Location :
Cluj-Napoca
Print_ISBN :
978-1-4673-0701-7
Type :
conf
DOI :
10.1109/AQTR.2012.6237703
Filename :
6237703
Link To Document :
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