Title :
Framework for fault analysis and test generation in DRAMs
Author :
Al-Ars, Zaid ; Hamdioui, Said ; Mueller, Georg ; Van de Goor, Ad J.
Author_Institution :
CatRam Solutions, Delft, Netherlands
Abstract :
With the increasing complexity of memory behavior, attempts are being made to come up with a methodical approach that employs electrical simulation to tackle the memory test problem. This paper describes a framework of algorithms and tools developed jointly by the Delft University of Technology and Infineon Technologies to systematically generate DRAM tests using Spice simulation. The proposed Spice-based test approach enjoys the advantage of being relatively inexpensive, yet highly accurate in describing the desired memory faulty behavior.
Keywords :
DRAM chips; SPICE; automatic test pattern generation; circuit simulation; failure analysis; fault diagnosis; integrated circuit testing; logic simulation; DRAM; Spice simulation; Spice-based test approach; electrical simulation; fault analysis framework; memory behavior complexity; memory faulty behavior; memory test; test generation; test generation framework; Analytical models; Computational modeling; Failure analysis; Laboratories; Manufacturing; Packaging; Performance evaluation; Random access memory; Testing; Wafer scale integration; DRAM testing; defect simulation; faulty behavior; test generation; tool framework;
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Print_ISBN :
0-7695-2288-2
DOI :
10.1109/DATE.2005.161