DocumentCode
2590902
Title
Mutation sampling technique for the generation of structural test data
Author
Scholive, M. ; Beroulle, V. ; Robach, C. ; Flottes, M.L. ; Rouzeyre, B.
Author_Institution
LCIS-ESISAR, Valence, France
fYear
2005
fDate
7-11 March 2005
Firstpage
1022
Abstract
The authors´ goal is to produce validation data that can be used as an efficient (pre) test set for structural stuck-at faults. In this paper, we detail an original test-oriented mutation sampling technique used for generating such data and we present a first evaluation on these validation data with regard to a structural test.
Keywords
automatic test pattern generation; fault diagnosis; integrated circuit testing; logic testing; mutation sampling technique; pre-test set; structural stuck-at faults; structural test; structural test data generation; test-oriented mutation sampling; validation data; Application software; Automatic test pattern generation; Automatic testing; Circuit faults; Degradation; Genetic mutations; Hardware; Sampling methods; Software measurement; Software testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2005. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2288-2
Type
conf
DOI
10.1109/DATE.2005.220
Filename
1395724
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