Title :
BB-GC: basic-block level garbage collection
Author :
Ozturk, Ozcan ; Kandemir, Mahmut ; Irwin, Mary Jane
Author_Institution :
Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
Abstract :
Memory space limitation is a serious problem for many embedded systems from diverse application domains. While circuit/packaging techniques are definitely important to squeeze large quantities of data/instruction into small size memories typically employed by embedded systems, software can also play a crucial role in reducing memory space demands of embedded applications. This paper focuses on a software-managed two-level memory hierarchy and instruction accesses. Our goal is to reduce on-chip memory requirements of a given application as much as possible, so that the memory space saved can be used by other simultaneously-executing applications. The proposed approach achieves this by tracking the lifetime of instructions. Specifically, when an instruction is dead (i.e. it could not be visited again in the rest of execution), we deallocate the on-chip memory space allocated to it. Working on the control flow graph representation of an embedded application, our approach performs basic block-level garbage collection for on-chip memories.
Keywords :
embedded systems; flow graphs; instruction sets; software engineering; storage management; BB-GC; application domains; basic-block level garbage collection; circuit/packaging techniques; control flow graph representation; data quantities; dead instruction on-chip memory space deallocation; embedded applications; embedded systems; instruction accesses; instruction lifetime tracking; instruction quantities; memory hierarchy; memory size; memory space; memory space demands; memory space limitation; simultaneously-executing applications; software-managed two-level memory; Application software; Circuits; Computer science; Embedded software; Embedded system; Energy efficiency; Packaging; Real time systems; Software packages; Software systems;
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Print_ISBN :
0-7695-2288-2
DOI :
10.1109/DATE.2005.80