RF characterization of multi-walled carbon nanotube and ZnO film

Summary form only given, as follows. Growing interest in carbon nanotubes (CNTs) and ZnO film opens consideration for their rf characteristics for future employment in electronic devices. Prior to the deployment and development for rf devices, the fundamentals about two materials are investigated. Multi-walled CNTs are characterized up to 50 GHz. Using the measured S-parameters, telegrapher´s equivalent-circuit models are extracted. And, for the ZnO film, the equivalent circuit parameters are obtained as well.