DocumentCode
2591942
Title
Reliability-centric high-level synthesis
Author
Tosun, S. ; Mansouri, N. ; Arvas, E. ; Kandemir, M. ; Xie, Yuan
Author_Institution
Syracuse Univ., NY, USA
fYear
2005
fDate
7-11 March 2005
Firstpage
1258
Abstract
The importance of addressing soft errors in both safety critical applications and commercial consumer products is increasing, mainly due to ever shrinking geometries, higher-density circuits, and employment of power-saving techniques such as voltage scaling and component shut-down. As a result, it is becoming necessary to treat reliability as a first-class citizen in system design. In particular, reliability decisions taken early in system design can have significant benefits in terms of design quality. Motivated by this observation, this paper presents a reliability-centric high-level synthesis approach that addresses the soft error problem. The proposed approach tries to maximize reliability of the design while observing the bounds on area and performance, and makes use of our reliability characterization of hardware components such as adders and multipliers. We implemented the proposed approach, performed experiments with several designs, and compared the results with those obtained by a prior proposal.
Keywords
adders; circuit reliability; high level synthesis; adders; commercial consumer products; design quality; multipliers; reliability-centric high-level synthesis; safety critical applications; soft errors; Adders; Circuits; Consumer products; Employment; Geometry; Hardware; High level synthesis; Power system reliability; Product safety; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe, 2005. Proceedings
ISSN
1530-1591
Print_ISBN
0-7695-2288-2
Type
conf
DOI
10.1109/DATE.2005.258
Filename
1395766
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