• DocumentCode
    2591942
  • Title

    Reliability-centric high-level synthesis

  • Author

    Tosun, S. ; Mansouri, N. ; Arvas, E. ; Kandemir, M. ; Xie, Yuan

  • Author_Institution
    Syracuse Univ., NY, USA
  • fYear
    2005
  • fDate
    7-11 March 2005
  • Firstpage
    1258
  • Abstract
    The importance of addressing soft errors in both safety critical applications and commercial consumer products is increasing, mainly due to ever shrinking geometries, higher-density circuits, and employment of power-saving techniques such as voltage scaling and component shut-down. As a result, it is becoming necessary to treat reliability as a first-class citizen in system design. In particular, reliability decisions taken early in system design can have significant benefits in terms of design quality. Motivated by this observation, this paper presents a reliability-centric high-level synthesis approach that addresses the soft error problem. The proposed approach tries to maximize reliability of the design while observing the bounds on area and performance, and makes use of our reliability characterization of hardware components such as adders and multipliers. We implemented the proposed approach, performed experiments with several designs, and compared the results with those obtained by a prior proposal.
  • Keywords
    adders; circuit reliability; high level synthesis; adders; commercial consumer products; design quality; multipliers; reliability-centric high-level synthesis; safety critical applications; soft errors; Adders; Circuits; Consumer products; Employment; Geometry; Hardware; High level synthesis; Power system reliability; Product safety; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2005. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2288-2
  • Type

    conf

  • DOI
    10.1109/DATE.2005.258
  • Filename
    1395766