DocumentCode :
2591942
Title :
Reliability-centric high-level synthesis
Author :
Tosun, S. ; Mansouri, N. ; Arvas, E. ; Kandemir, M. ; Xie, Yuan
Author_Institution :
Syracuse Univ., NY, USA
fYear :
2005
fDate :
7-11 March 2005
Firstpage :
1258
Abstract :
The importance of addressing soft errors in both safety critical applications and commercial consumer products is increasing, mainly due to ever shrinking geometries, higher-density circuits, and employment of power-saving techniques such as voltage scaling and component shut-down. As a result, it is becoming necessary to treat reliability as a first-class citizen in system design. In particular, reliability decisions taken early in system design can have significant benefits in terms of design quality. Motivated by this observation, this paper presents a reliability-centric high-level synthesis approach that addresses the soft error problem. The proposed approach tries to maximize reliability of the design while observing the bounds on area and performance, and makes use of our reliability characterization of hardware components such as adders and multipliers. We implemented the proposed approach, performed experiments with several designs, and compared the results with those obtained by a prior proposal.
Keywords :
adders; circuit reliability; high level synthesis; adders; commercial consumer products; design quality; multipliers; reliability-centric high-level synthesis; safety critical applications; soft errors; Adders; Circuits; Consumer products; Employment; Geometry; Hardware; High level synthesis; Power system reliability; Product safety; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2288-2
Type :
conf
DOI :
10.1109/DATE.2005.258
Filename :
1395766
Link To Document :
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