Title :
Automatic formal verification of fused-multiply-add FPUs
Author :
Jacobi, Christian ; Weber, Kai ; Paruthi, Viresh ; Baumgartner, Jason
Author_Institution :
IBM Deutschland GmbH, Boeblingen, Germany
Abstract :
In this paper we describe a fully-automated methodology for formal verification of fused-multiply-add floating point units (FPU). Our methodology verifies an implementation FPU against a simple reference model derived from the processor´s architectural specification, which may include all aspects of the IEEE specification including denormal operands and exceptions. Our strategy uses a combination of BDD- and SAT-based symbolic simulation. To make this verification task tractable, we use a combination of case-splitting, multiplier isolation, and automatic model reduction techniques. The case-splitting is defined only in terms of the reference model, which makes this approach easily portable to new designs. The methodology is directly applicable to multi-GHz industrial implementation models (e.g., HDL or gate-level circuit representations) that contain all details of the high-performance transistor-level model, such as aggressive pipelining, clocking, etc. Experimental results are provided to demonstrate the computational efficiency of this approach.
Keywords :
binary decision diagrams; coprocessors; exception handling; floating point arithmetic; formal specification; formal verification; pipeline processing; BDD; IEEE specification; SAT-based symbolic simulation; aggressive pipelining; automatic formal verification; automatic model reduction; case-splitting; clocking; denormal operands; exceptions; floating point units; fused-multiply-add FPU; high-performance transistor-level model; multiplier isolation; processor architectural specification; Boolean functions; Circuits; Clocks; Data structures; Emulation; Formal verification; Hardware design languages; Jacobian matrices; Pipeline processing; Reduced order systems;
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Print_ISBN :
0-7695-2288-2
DOI :
10.1109/DATE.2005.75