• DocumentCode
    2592135
  • Title

    Encoding-based minimization of inductive cross-talk for off-chip data transmission

  • Author

    LaMeres, Brock J. ; Khatri, Sunil P.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
  • fYear
    2005
  • fDate
    7-11 March 2005
  • Firstpage
    1318
  • Abstract
    Inductive cross-talk within IC packaging is becoming a significant bottleneck in high-speed inter-chip communication. The parasitic inductance within IC packaging causes bounce on the power supply pins in addition to glitches and rise-time degradation on the signal pins. Until recently, the parasitic inductance problem was addressed by aggressive package design. We present a technique to encode the off-chip data transmission to limit bounce on the supplies and reduce inductive signal coupling due to transitions on neighboring signal lines. Both these performance limiting factors are modeled in a common mathematical framework. Our experimental results show that the proposed encoding based techniques result in reduced supply bounce and signal degradation due to inductive cross-talk, closely matching the theoretical predictions. We demonstrate that the overall bandwidth of a bus actually increases by 85% using our technique, even after accounting for the encoding overhead. The asymptotic bus size overhead is between 30% and 50%, depending on how stringent the user-specified inductive cross-talk parameters are.
  • Keywords
    codecs; crosstalk; data communication; electromagnetic interference; encoding; minimisation; IC packaging; asymptotic bus size overhead; bandwidth; codec; inductive cross-talk minimization; inductive signal coupling; inter-chip communication; mathematical framework; off-chip data transmission encoding; parasitic inductance; power supply pins; signal degradation; signal pins; supply bounce; Bandwidth; Couplings; Data communication; Degradation; Encoding; Inductance; Integrated circuit packaging; Mathematical model; Pins; Power supplies;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2005. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2288-2
  • Type

    conf

  • DOI
    10.1109/DATE.2005.134
  • Filename
    1395775