Broadband scanning microwave microscopy investigation of Graphene

Summary form only given, as follows. In this work, we describe the application to a Graphene flake of a dual-channel scanning probe microscope, able to perform simultaneously tunnel current and wide-band near field microwave measurements. We achieve high quality microwave images with nanometric resolution. The Graphene sample is deposited on a substrate of SiO2 with an additional deposition of gold (a contact finger). The preliminary measurements seem to show evidences of localized change of impedance near the edge of the flake.