A rigorous solution to the low-frequency breakdown in full-wave finite-element-based analysis of general problems involving inhomogeneous lossy dielectrics and non-ideal conductors

Summary form only given, as follows. A rigorous method is developed to fundamentally eliminate the low frequency breakdown problem for full-wave finite-element based analysis of general 3-D problems involving inhomogeneous lossy dielectrics and non-ideal conductors. In this method, the frequency dependence of the solution to Maxwell´s equations is explicitly derived from DC to any high frequency. The proposed method has been validated by the analysis of realistic on-chip circuits at frequencies as low as DC.