Title :
Development of a waveguide microwave power sensor calibration system at NMC
Author :
Meng, Yu Song ; Shan, Yueyan ; Neo, Hoon
Author_Institution :
Nat. Metrol. Centre, A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
Abstract :
In this paper, the development of a waveguide microwave power sensor calibration system is reported. This system is a physical realization of the direct comparison transfer of waveguide microwave power sensor calibration up to 110 GHz. For the developed calibration system, the measurement uncertainty is discussed and evaluated, where the major uncertainty contributor for the current system is identified. To further improve the performance of our system and reduce the cost of calibration, some necessary future work is planned.
Keywords :
calibration; measurement uncertainty; microwave detectors; microwave measurement; microwave power transmission; NMC; calibration system; measurement uncertainty; waveguide microwave power sensor; Current measurement; Measurement uncertainty; Microwave measurements; Monitoring; Standards;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2012 Asia-Pacific Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1557-0
Electronic_ISBN :
978-1-4577-1558-7
DOI :
10.1109/APEMC.2012.6237808