Statistical microwave circuit optimization via a non-derivative trust region approach and space mapping surrogates

Summary form only given, as follows. A novel yield optimization technique for microwave circuits is presented. Yield optimization of microwave circuits is obstructed by the high expense of EM simulations required in yield evaluations in addition to the absence of any gradient information. In the proposed technique, surrogates using the GSM algorithm are incorporated with a derivative-free TR optimization method NEWUOA. A variance reduction technique is implemented in yield estimation. Practical examples are illustrated.