Stochastic Assessment of Phase-Angle Jumps Caused by Voltage Sags Applying an Analytical Method

Several stochastic methods for voltage sag prediction have been proposed in recent years. These methods usually combine short circuit calculations with historic fault rates data to provide voltage sags estimations. This paper uses an analytical method for stochastic prediction of sags with the aim of providing a better understanding about the phase-angle jump associated to voltage sags. This analytical method allows obtaining the phase-angle jump as a continuous function of the distance to the fault Two simple networks, one of them radial and the other meshed, have been used to analyze the influence of the topology on phase-angle jumps. The effect produced by the variation of the X/R ratio of line impedances and the study of unbalanced faults are other analyses performed at the IEEE 24-buses system