DocumentCode :
2592846
Title :
Debug support, calibration and emulation for multiple processor and powertrain control SoCs [automotive applications]
Author :
Mayer, A. ; Siebert, H. ; McDonald-Maier, K.D.
Author_Institution :
Automotive & Ind., Infineon Technol. AG, Munich, Germany
fYear :
2005
fDate :
7-11 March 2005
Firstpage :
148
Abstract :
The introduction of complex SoCs with multiple processor cores presents new development challenges, such that development support is now a decisive factor when choosing a system-on-chip (SoC). The presented development support strategy addresses the challenges using both architecture and technology approaches. The multi-core debug support (MCDS) architecture provides flexible triggering using cross triggers and a multiple core break and suspend switch. Temporal trace ordering is guaranteed down to cycle level by on-chip time stamping. The package sized-ICE (PSI) approach is a novel method of including trace buffers, overlay memories, processing resources and communication interfaces without changing device behavior. PSI requires no external emulation box, as the debug host interfaces directly with the SoC using a standard interface.
Keywords :
automotive electronics; calibration; development systems; logic testing; multiprocessing systems; program debugging; system-on-chip; MCDS; automotive electronic systems; circuit emulation; communication interfaces; cross triggers; cycle level temporal trace ordering; debug host interface; development support; flexible triggering; in-circuit emulators; multiple core break/suspend switch; multiple core debug support; multiple processor cores; on-chip debug support circuits; on-chip time stamping; overlay memories; package sized-ICE; powertrain control SoC; processing resources; system calibration; trace buffers; Automotive engineering; Calibration; Control systems; Emulation; Ice; Mechanical power transmission; Process control; Production systems; Switches; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
ISSN :
1530-1591
Print_ISBN :
0-7695-2288-2
Type :
conf
DOI :
10.1109/DATE.2005.109
Filename :
1395811
Link To Document :
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