• DocumentCode
    2592846
  • Title

    Debug support, calibration and emulation for multiple processor and powertrain control SoCs [automotive applications]

  • Author

    Mayer, A. ; Siebert, H. ; McDonald-Maier, K.D.

  • Author_Institution
    Automotive & Ind., Infineon Technol. AG, Munich, Germany
  • fYear
    2005
  • fDate
    7-11 March 2005
  • Firstpage
    148
  • Abstract
    The introduction of complex SoCs with multiple processor cores presents new development challenges, such that development support is now a decisive factor when choosing a system-on-chip (SoC). The presented development support strategy addresses the challenges using both architecture and technology approaches. The multi-core debug support (MCDS) architecture provides flexible triggering using cross triggers and a multiple core break and suspend switch. Temporal trace ordering is guaranteed down to cycle level by on-chip time stamping. The package sized-ICE (PSI) approach is a novel method of including trace buffers, overlay memories, processing resources and communication interfaces without changing device behavior. PSI requires no external emulation box, as the debug host interfaces directly with the SoC using a standard interface.
  • Keywords
    automotive electronics; calibration; development systems; logic testing; multiprocessing systems; program debugging; system-on-chip; MCDS; automotive electronic systems; circuit emulation; communication interfaces; cross triggers; cycle level temporal trace ordering; debug host interface; development support; flexible triggering; in-circuit emulators; multiple core break/suspend switch; multiple core debug support; multiple processor cores; on-chip debug support circuits; on-chip time stamping; overlay memories; package sized-ICE; powertrain control SoC; processing resources; system calibration; trace buffers; Automotive engineering; Calibration; Control systems; Emulation; Ice; Mechanical power transmission; Process control; Production systems; Switches; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe, 2005. Proceedings
  • ISSN
    1530-1591
  • Print_ISBN
    0-7695-2288-2
  • Type

    conf

  • DOI
    10.1109/DATE.2005.109
  • Filename
    1395811