Title :
The integration of on-line monitoring and reconfiguration functions using IEEE1149.4 into a safety critical automotive electronic control unit
Author :
Jeffrey, C. ; Cutajar, R. ; Prosser, S. ; Lickess, M. ; Richardson, A. ; Riches, S.
Author_Institution :
Centre for Microsystems Eng., Lancaster Univ., UK
Abstract :
This paper presents an innovative application of IEEE 1149.4 and the integrated diagnostic reconfiguration (IDR) as tools for the implementation of an embedded test solution for an automotive electronic control unit, implemented as a fully integrated mixed signal system. The paper describes how the test architecture can be used for fault avoidance with results from a hardware prototype presented. The paper concludes that fault avoidance can be integrated into mixed signal electronic systems to handle key failure modes.
Keywords :
automotive electronics; boundary scan testing; circuit reliability; circuit testing; condition monitoring; embedded systems; failure analysis; fault tolerance; microcontrollers; mixed analogue-digital integrated circuits; modules; reconfigurable architectures; FMEA; IDR; IEEE 1149.4; automotive system reliability; boundary scan test; embedded test; failure analysis; failure modes; fault avoidance; fully integrated mixed signal system; integrated diagnostic reconfiguration; microcontrollers; modules; on-line monitoring; on-line reconfiguration; safety critical automotive electronic control unit; safety critical sub-systems; Automotive electronics; Automotive engineering; Circuit faults; Consumer electronics; Control systems; Electronic equipment testing; Engines; Hardware; Monitoring; Safety;
Conference_Titel :
Design, Automation and Test in Europe, 2005. Proceedings
Print_ISBN :
0-7695-2288-2
DOI :
10.1109/DATE.2005.308
